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QT-3104 QG gate charge test
QT-3104 QG meets the tiny QG value test of SiC devices.
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Support double DIE |
Overload and undervoltage protection |
High precision testing |
Support extension |
| Model | QT-3104 QG |
| Product Advantages | Meets the tiny QG value test of SiC devices |
| Key Features | ? Test capability: 200A/150V 150A/1000V |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
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