-
QT-8400D power device multi-site test system -
QT-8400GaN Gallium Nitride Test System -
QT-4100 power device test system -
KGD (Know Good Die) testing solution -
QT-DRM101000 GaN Dynamic RDON -
QT-8409PIM high-power dynamic and static comprehensive test system -
QT-6000 Discrete Device High-Speed Test System -
QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount) -
QT-3108 SW IGBT/SiC dynamic test -
QT-8409IPM Intelligent Power Module Test System -
QT-8200 PRO Digital-Analog Hybrid IC Test System (Hard-Docking) -
QT-3104 QG gate charge test -
QT-3101 UIL avalanche test -
QT-8600RF Mixed Signal RF Test System -
QT-3102 thermal resistance tester -
QT-3107 LCR RG/CG test -
QT-3105 TRR diode reverse recovery test
|
No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
|
+86 757 83207313 (Sales) |
|
+86 757 83208786 (Sales) |
|
info@powertechsemi.com |
Copyright PowerTECH industrial Co., Ltd. Powertechsmemi.com ? 2015 | Privacy policy | Sitmap 粤ICP备17127080号-1
